The Avantgarde 4K closed-cycle cryogenic probe station plays a vital role in scientific research and technology development. The Avantgarde 4K closed-cycle cryogenic probe station plays a vital role in scientific research and technology development. It is capable of performing a variety of non-destructive physical and electrical tests on samples at low temperatures, which helps researchers to gain a deeper understanding of the physical and electrical properties of a material or a device, and thus provides important data to support the research and development of new materials and their applications.
PSM-4K series cryogenic probe station is a closed-cycle cryogenic probe station with excellent performance. Its compact and low vibration design can provide a <5K-350K high and low temperature vacuum testing environment for the electrical parameter testing of semiconductor chips, and through the external connection of different electrical measuring instruments, it can complete the testing of IV, CV, optical and microwave parameters of materials/devices, and realize the cryogenic vacuum environment for the testing of chips, wafers and microwaves. Non-destructive electrical testing of chips, wafers and devices under low-temperature vacuum environment.
Features
- Closed-cycle refrigeration without liquid helium consumption, with a minimum temperature of 4.5K.
- Probe arm displacement adjustment is operated outside the vacuum chamber, allowing the switching of different devices on the sample for testing without destroying the vacuum.
- The unique four-dimensional X-Y-Z-R adjustment of the probe arm allows for testing of samples up to 4 inches.
- The vacuum chamber is made of aluminum, which can effectively reduce the external electromagnetic interference and improve the accuracy and stability of the test.
- The probe arm adopts tri-coaxial connector, good leakage performance, measured leakage current is less than 100fA @
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- Wide test temperature range, maximum support 4.5K-350K continuous temperature change.
- Uniquely designed flexible probe, the probe is mounted on the copper shrapnel, avoiding excessive force during the pinning process leading to sample or electrode damage.
